TEXAS TECH X-RAY IMAGING SYSTEM AWARDED PATENT
April 5, 2005
FOR IMMEDIATE RELEASE
Date: April 5, 2005
CONTACT: Cory Chandler, firstname.lastname@example.org
LUBBOCK – Two Texas Tech University researchers have been awarded a patent for their
innovative X-ray technique to more accurately price and grade cotton crops.
Hamed Sari-Sarraf, an associate professor in the Electrical and Computer Engineering
Department, and Eric Hequet, associate director of Texas Tech’s International Textile
Center, were awarded the patent for their groundbreaking new method of analyzing contaminants
Their system uses X-ray imaging to probe cotton samples for contaminants – commonly
referred to as “trash.” This technique provides a non-invasive and more accurate way
for the cotton industry to grade and price cotton for market.
The amount and character of trash in a bale of cotton has a direct impact on the cotton’s
usefulness to textile manufacturers and determines its market value.
The current method of scanning cotton samples with High Volume Instruments does not
penetrate the surface, Hequet said.
“With the current grading system, you look at the surface of the cotton,” he said.
“If the contaminant is not on the surface, you do not see it.”
CONTACT: Mike Stephens, communications coordinator at the International Textile Center,
Texas Tech University, (806) 747-3790, ext. 513, or Michael.email@example.com.
Hamed Sari-Sarraf, associate professor in the Electrical and Computer Engineering
Department, Texas Tech University, (806) 742-3533, or Hamed.firstname.lastname@example.org.